Scholarly record
Publications
Twelve peer-reviewed papers spanning electron and ion transport, scattering physics, semiconductor metrology, uncertainty quantification, nanostructures, and data-driven methods.
Current work
Manuscripts in progress
These items are separated from the peer-reviewed record so their status is unambiguous.
Morphological Effect of Microstructures on Anti-irradiation Tolerance of FeNiAl Superlattice Alloys
M. S. S. Khan, Y. X. Xiong, M. Yousaf, F. Cheng, and Y. G. Li.
Secondary Electron Emission from Carbon Nanotubes
Spatial emission maps and wall-count scaling are presented as work in progress on the electron-transport page.
Peer reviewed
Complete publication list
Publication titles are shown first; journal, year, DOI, and supplied PDF follow as supporting evidence.
Monte Carlo study of the electron emission yields of germanium
H. I. Imtiaz, Y. B. Zou, S. F. Mao, M. S. S. Khan, Z. J. Ding
An Extended-Isomap for high-dimensional data accuracy and efficiency: a comprehensive survey
M. Yousaf, M. S. S. Khan, S. Ullah
Electron backscattering coefficients for Cr, Co, and Pd solids: a Monte Carlo study
H. I. Imtiaz, M. S. S. Khan, A. Hussain, S. F. Mao, Y. B. Zou, Z. J. Ding
Uncertainty evaluation of Monte Carlo simulated line-scan profiles of a critical-dimension SEM (CD-SEM)
M. S. S. Khan, S. F. Mao, Y. B. Zou, Y. G. Li, B. Da, Z. J. Ding
An extensive theoretical quantification of secondary-electron emission from silicon
M. S. S. Khan, S. F. Mao, Y. B. Zou, D. B. Lu, B. Da, Y. G. Li, Z. J. Ding
A theoretical characterization method for non-spherical core–shell nanoparticles by XPS
J. M. Gong, M. S. S. Khan, B. Da, H. Yoshikawa, S. Tanuma, Z. J. Ding
NR-Isomap: an incremental approach with Gaussian-process kernels for denoising
M. Yousaf, M. S. S. Khan, S. Ullah, S. Wang, L. Jing
Influence of energy-loss function on the Monte Carlo simulated electron backscattering coefficient
H. Chen, Y. B. Zou, S. F. Mao, M. S. S. Khan, K. Tőkési, Z. J. Ding
CD-SEM characterization of smoothly varying wave structures with a Monte Carlo simulation
M. S. S. Khan, L. H. Yang, X. Deng, S. F. Mao, Y. B. Zou, Y. G. Li, H. M. Li, Z. J. Ding
NRIC: a noise-removal approach for the nonlinear Isomap method
M. Yousaf, M. S. S. Khan, T. U. Rehman, S. Ullah, L. Jing
Monte Carlo simulation of secondary-electron emission from wave-type structure
M. S. S. Khan, Y. B. Zou, C. Li, Z. J. Ding
Use of a model-based library in critical-dimension measurement by CD-SEM
Y. B. Zou, M. S. S. Khan, H. M. Li, Y. G. Li, W. Li, S. T. Gao, L. S. Liu, Z. J. Ding